DocumentCode
1977219
Title
Origins of electromagnetic immunity holes of microcontrollers
Author
Su, Tao ; Steinecke, Thomas ; Unger, Markus
Author_Institution
Center for the ASIC Design, Sun Yat-sen Univ., Guangzhou, China
fYear
2010
fDate
7-9 Dec. 2010
Firstpage
1
Lastpage
4
Abstract
This paper describes the origins of one kind of the degradation of the electromagnetic immunity of microcontrollers. That immunity degradation is strongly frequency dependent. They appear like holes in immunity-frequency curve. Mechanism based on resonance in two types of current loops is introduced to explain the formation of those immunity holes. Measurement results are given to support the introduced theory.
Keywords
electromagnetic interference; microcontrollers; electromagnetic immunity holes; frequency dependent; immunity degradation; immunity-frequency curve; microcontrollers; Capacitors; Integrated circuit modeling; Microcontrollers; Oscillators; Pins; Predictive models; Resonant frequency;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE
Conference_Location
Singapore
ISSN
2151-1225
Print_ISBN
978-1-4244-9068-4
Electronic_ISBN
2151-1225
Type
conf
DOI
10.1109/EDAPS.2010.5683027
Filename
5683027
Link To Document