Design of TEM cell and high sensitive probe for EMI analysis of built-in Webcam module

Author

Lin, Han-Nien ; Kuo, Chung-Wei ; Liao, Jhih-Min ; Dong, Jian-Li

Author_Institution

Dept. of Commun. Eng., Feng-Chia Univ., Taichung, Taiwan

fYear

2010

fDate

7-9 Dec. 2010

Firstpage

1

Lastpage

4

Abstract

Since many extremely susceptible components with low-voltage operation or high sensitivity may be affected from EMI noise and thus degrade their performance, the EMI phenomena from IC becomes an issue for semiconductor industry. In this paper, we have designed a TEM Cell and magnetic field probe with high sensitivity and spatial resolution, in accordance with the IC-EMI measurement standard IEC 61967-2 and IEC 61967-3 respectively. The goal is to setup a more accurate measurement of the noise source location and the corresponding frequency bands to analyze the platform noise effect. The operating frequency of TEM Cell has been raised up to 2.43 GHz. Two identical IC for Webcam module with some minor modifications were used for EMI measurement and further analysis for the interference effects.

Keywords

CMOS image sensors; TEM cells; electromagnetic interference; integrated circuit measurement; integrated circuit noise; monolithic integrated circuits; probes; EMI analysis; IC-EMI measurement; TEM cell; built-in Webcam module; high sensitive probe; magnetic field probe; noise source location; semiconductor industry; spatial resolution; Cameras; Electromagnetic interference; Frequency measurement; Noise; Probes; Sensitivity; TEM cells;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Design of Advanced Packaging & Systems Symposium (EDAPS), 2010 IEEE

Conference_Location

Singapore

ISSN

2151-1225

Print_ISBN

978-1-4244-9068-4

Electronic_ISBN

2151-1225

Type

conf

DOI

10.1109/EDAPS.2010.5683030

Filename

5683030