DocumentCode
1977537
Title
Determination of refractive indices of optical wafers by interferometric method
Author
Choi, Hee Joo ; Lim, Hwan Hong ; Bae, In-ho ; Moon, Han Seb ; Cha, Myoungsik ; Eom, Tae Bong ; Ju, Jung Jin
Author_Institution
Dept. of Phys., Pusan Nat. Univ., Busan, South Korea
fYear
2009
fDate
30-3 Aug. 2009
Firstpage
1
Lastpage
2
Abstract
For accurate index measurement, we investigated Fabry-Perot type interference from optical wafers. Since this method is insensitive to environmental perturbation and simple to implement, it can be used to establish dispersion formula for newly developed optical materials.
Keywords
Fabry-Perot interferometers; light interferometry; optical materials; refractive index measurement; dispersion formula; environmental perturbation; interferometric method; optical materials; optical wafers; refractive index measurement; Fabry-Perot; Fiber nonlinear optics; Frequency conversion; Nonlinear optics; Optical interferometry; Optical materials; Optical refraction; Optical sensors; Optical variables control; Refractive index; Fabry-Perot; index of refraction; interference; optical crystal; optical material;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on
Conference_Location
Shanghai
Print_ISBN
978-1-4244-3829-7
Electronic_ISBN
978-1-4244-3830-3
Type
conf
DOI
10.1109/CLEOPR.2009.5292472
Filename
5292472
Link To Document