• DocumentCode
    1977725
  • Title

    On the Degradation of MEMS Gyroscope Performance in the Presence of High Power Acoustic Noise

  • Author

    Dean, R.N. ; Flowers, G.T. ; Hodel, A.S. ; Roth, G. ; Castro, S. ; Zhou, R. ; Moreira, A. ; Ahmed, A. ; Rifki, R. ; Grantham, B.E. ; Bittle, D. ; Brunsch, J.

  • Author_Institution
    Auburn Univ., Auburn
  • fYear
    2007
  • fDate
    4-7 June 2007
  • Firstpage
    1435
  • Lastpage
    1440
  • Abstract
    Due to their reduced size, cost, and power requirements relative to traditional gyroscopes, MEMS gyroscopic sensors are finding increasing use in many applications. It is well known that unshielded MEMS gyroscopes can be vulnerable to both mechanical shock and high frequency vibrations. The results of this investigation indicate that MEMS gyroscopes are also susceptible to high power, high frequency content acoustic noise. Acoustic energy frequency components that are close to the resonating frequency of the proof mass in the MEMS gyroscope can produce undesirable motion of the proof mass, resulting in corruption in the angular rate measurement. If the acoustic signals possess enough power in the vicinity of the sensor resonating frequency, the resulting degradation in sensor performance can be severe enough to render the angular rate measurements useless.
  • Keywords
    acoustic noise; gyroscopes; microsensors; MEMS gyroscopic sensors; acoustic energy frequency components; acoustic signals; angular rate measurement; degradation; high frequency vibrations; high power acoustic noise; mechanical shock; sensor resonating frequency; Acoustic measurements; Acoustic noise; Acoustic sensors; Costs; Degradation; Frequency measurement; Gyroscopes; Mechanical sensors; Micromechanical devices; Resonant frequency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2007. ISIE 2007. IEEE International Symposium on
  • Conference_Location
    Vigo
  • Print_ISBN
    978-1-4244-0754-5
  • Electronic_ISBN
    978-1-4244-0755-2
  • Type

    conf

  • DOI
    10.1109/ISIE.2007.4374812
  • Filename
    4374812