Title :
Density Independent Moisture Meter at X-Band
Author :
Jacobsen, R. ; Meyer, W. ; Schrage, B.
Author_Institution :
Philips GmbH, Forschungslaboratorium Hamburg, 2000 Hamburg 54, Federal Republic of Germany
Abstract :
A new method of density independent moisture determination at one single frequency is developed. It is based on the two-parameter-measurement of the complex dielectric constant being composed to a density independent calibration curve A(¿) which is a function of the moisture content ¿ only. The feasibility of this principle is demonstrated by an industrial moisture meter at 9 GHz for different materials and sensing heads.
Keywords :
Applicators; Calibration; Conducting materials; Density measurement; Dielectric constant; Dielectric materials; Frequency; Microstrip; Moisture; Temperature dependence;
Conference_Titel :
Microwave Conference, 1980. 10th European
Conference_Location :
Warszawa, Poland
DOI :
10.1109/EUMA.1980.332834
