Title :
Development of composite multi-layered PZT thin films for microactuator
Author :
Li, L. ; Aoyagi, S. ; Arai, Y. ; Tagawa, N.
Author_Institution :
Kansai Univ., Osaka
Abstract :
It is necessary to develop high performance microactuator in order to achieve it operating at very low applied voltage. This paper describes the development of composite multi-layered PZT thin films for microactuator. The piezoelectric properties for 8 kinds of composite multi-layered PZT thin films are fabricated and studied. The ferroelectric polarization - electric (P-E) hysteresis loops of the films is also measured and discussed. According to the results of P-E hysteriesis loops, for these different composite films, most optimum composite form - sol-gel + sputter composite double-layered PZT thin films, which combined with conventional RF sputtering and sol-gel processing methods, exhibit excellent remnant polarization and coercive fields of 14.87 uC/cm2 and 32.359 KV/cm in 5 V and 25.46 uC/cm2 and 41.94 KV/cm in 7 V, respectively. The crystalline structure and growth behavior of films have been studied by X-ray diffraction. The sol-gel + sputter composite double-layered PZT thin films lead to the highly (111) oriented PZT thin films. Moreover the applications of the composite double-layered PZT thin films, the diaphragm micro actuator for ultrasonic sensor is developed.
Keywords :
composite materials; dielectric hysteresis; lead compounds; microactuators; piezoelectric actuators; piezoelectric materials; piezoelectric thin films; ultrasonic devices; zirconium compounds; (111) oriented PZT thin films; PZT; PZT - Interface; RF sputtering processing; X-ray diffraction; composite multi-layered PZT thin films; crystalline structure; diaphragm micro actuator; double-layered thin films; ferroelectric polarization-electric hysteresis loop; growth behavior; microactuator; piezoelectric property; sol-gel processing; ultrasonic sensor; Ferroelectric films; Ferroelectric materials; Hysteresis; Low voltage; Microactuators; Piezoelectric films; Piezoelectric polarization; Sputtering; Thin film sensors; Transistors;
Conference_Titel :
Industrial Electronics, 2007. ISIE 2007. IEEE International Symposium on
Conference_Location :
Vigo
Print_ISBN :
978-1-4244-0754-5
Electronic_ISBN :
978-1-4244-0755-2
DOI :
10.1109/ISIE.2007.4374820