DocumentCode :
1978363
Title :
Versatile march test generator for hands-on memory testing laboratory
Author :
Galliere, J.-M. ; Dilillo, L.
Author_Institution :
Polytech. Montpellier, Univ. of Montpellier, Montpellier, France
fYear :
2011
fDate :
5-6 June 2011
Firstpage :
41
Lastpage :
42
Abstract :
Generally, in the studies of microelectronics engineer the approach of IC testing remains very theoretical. Only few concrete practices are commonly done and generally laboratory experiences are limited to the use of CAD tools. For this purpose, in our teaching department, we develop an experiment allowing a concrete learning of IC testing dedicated to the test of commercial memory chips. Through this environment, our students reached a better knowledge of the connection between the test sequences and the detected faults.
Keywords :
SRAM chips; integrated circuit testing; CAD tools; IC testing; SRAM memory test bench; hands-on memory testing laboratory; memory chips; microelectronic engineer; versatile march test generator; Circuit faults; Education; Generators; Memory management; Microelectronics; Random access memory; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Systems Education (MSE), 2011 IEEE International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4577-0548-9
Electronic_ISBN :
978-1-4577-0550-2
Type :
conf
DOI :
10.1109/MSE.2011.5937088
Filename :
5937088
Link To Document :
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