Creating a mixed-signal test and product engineering course

Author

Hudson, Tina A. ; Copeland, Bryan ; Solomon, Deidrick

Author_Institution

Dept. of Electr. & Comput. Eng., Rose-Hulman Inst. of Technol., Terre Haute, IN, USA

fYear

2011

fDate

5-6 June 2011

Firstpage

56

Lastpage

59

Abstract

The paper presents a new mixed-signal test engineering course geared for undergraduate seniors and master´s-level graduate students. The course provides a capstone experience for our electrical and computer engineering students, integrating many undergraduate topics while providing industrial hands-on experiences. The students were enthusiastic about the real-world experiences with an industrial grade automatic tester (ATE), the knowledge gained about data converters, and felt that the course had a good integration of lectures and labs.

Keywords

computer science education; educational courses; electrical engineering education; electronic engineering education; mixed analogue-digital integrated circuits; ATE; computer engineering student; data converter; electrical engineering student; industrial grade automatic tester; master-level graduate student; mixed-signal test engineering course; undergraduate senior; Computers; Electronics industry; Instruments; Integrated circuits; Testing; Transfer functions; capstone course; mixed-signal circuits; new course development; test engineering;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Systems Education (MSE), 2011 IEEE International Conference on

Conference_Location

San Diego, CA

Print_ISBN

978-1-4577-0548-9

Electronic_ISBN

978-1-4577-0550-2

Type

conf

DOI

10.1109/MSE.2011.5937092

Filename

5937092