Title :
A digital fractional-N PLL with a 3mW 0.004mm2 6-bit PVT and mismatch insensitive TDC
Author :
Kim, Hyung Seok ; Ornelas, Carlos ; Chandrashekar, Kailash ; Su, Pin-en ; Madoglio, Paolo ; Li, Y. William ; Ravi, Ashoke
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
In this paper, a 3mW 0.004mm2 6-bit time-to-digital converter (TDC) is presented. By re-using a single delay cell and sampling flip-flop (FF), mismatch free operation is achieved. PVT variations are tracked and corrected by a digital frequency lock loop (DFLL). The proposed TDC is demonstrated in a digital fractional-N PLL for WiFi/4G radios. A 20-bit high dynamic range (DR) digital-to-analog converter (DAC) drives the VCO to achieve 100Hz resolution. The PLL is fabricated in 32nm digital SoC CMOS with a flip-chip BGA package. The PLL produces a 2.5GHz band LO output with -35dBc integrated phase noise (10kHz to 10MHz) and the worst case spur less than -50dBc while consuming 21mW.
Keywords :
4G mobile communication; ball grid arrays; flip-chip devices; flip-flops; frequency locked loops; low-power electronics; phase locked loops; system-on-chip; time-digital conversion; wireless LAN; 4G radio; PVT; SoC CMOS; WiFi radio; digital fractional-N PLL; digital frequency lock loop; dynamic range digital-to-analog converter; flip-chip BGA package; frequency 100 Hz; frequency 2.5 GHz; mismatch free operation; power 21 mW; power 3 mW; sampling flip-flop; single delay cell; size 32 nm; time-to-digital converter; word length 20 bit; word length 6 bit; CMOS integrated circuits; Delay; Phase locked loops; Phase noise; Quantization; Shift registers; Voltage-controlled oscillators;
Conference_Titel :
ESSCIRC (ESSCIRC), 2012 Proceedings of the
Conference_Location :
Bordeaux
Print_ISBN :
978-1-4673-2212-6
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2012.6341291