Title :
RF performance of InGaAs-based T-gate junctionless field-effect transistors which applicable for high frequency network systems
Author :
Jae Hwa Seo ; Young Jun Yoon ; Sung Yoon Kim ; Young Jae Kim ; In Man Kang
Author_Institution :
Sch. of Electron. Eng., Kyungpook Nat. Univ., Deagu, South Korea
Abstract :
The T-gate InGaAs-based JLFET´s which has high frequency RF characteristics have been demonstrated by TCAD tool. To achieve advanced performance of RF characteristics, the T-gate structure is applied, also. By T-gate structure we decrease gate resistance (RG) and achieve a higher maximum oscillation frequency (fmax) compare with planar-type structure. However, the increase of parasitic gate capacitance degrades current gain cut-off frequency (fT) and this trade-off between parasitic components and optimal device structure will be discussed.
Keywords :
capacitance; field effect transistors; gallium arsenide; indium compounds; oscillations; radiofrequency integrated circuits; technology CAD (electronics); InGaAs; RF characteristic performance; T-gate junctionless field-effect transistor structure; TCAD tool; current gain cut-off frequency; gate resistance; high frequency network systems; maximum oscillation frequency; optimal device structure; parasitic gate capacitance component; planar-type structure; Capacitance; Cutoff frequency; Indium gallium arsenide; Indium phosphide; Logic gates; Radio frequency; Transistors; High-frequency network; InGaAs; JL-FinFET; RF characteristics;
Conference_Titel :
Information Networking (ICOIN), 2015 International Conference on
Conference_Location :
Cambodia
DOI :
10.1109/ICOIN.2015.7057959