DocumentCode :
1980273
Title :
Nitrogen Implantation Induced Intermixing in InAs/InAlGaAs/InP Dots-in-Well Laser
Author :
Djie, Hery S. ; Wang, Yang ; Ooi, Boon S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Lehigh Univ., Bethlehem, PA
fYear :
0
fDate :
0-0 0
Firstpage :
270
Lastpage :
273
Abstract :
Nitrogen implantation has been performed to promote the group-III intermixing in InAs quantum dots embedded in InAlGaAs quantum-well laser structure. A differential bandgap shift as large as 112 nm (65 meV) has been observed after nitrogen implantation at 5times1012 ions/cm2, 1500 keV and annealing at 700degC. The intermixing activation is found to occur at a lower temperature than the typical dielectric cap annealing induced intermixing technique. The implantation induced a vacancy peaks at 1.5 mum above the active region. The point defects diffuse efficiently through the active region during subsequent annealing and induced quantum-dot intermixing with improved luminescence at a relatively low activation annealing temperature
Keywords :
III-V semiconductors; aluminium compounds; annealing; energy gap; gallium arsenide; indium compounds; ion implantation; nitrogen; photoluminescence; point defects; quantum well lasers; semiconductor quantum dots; 1.5 mum; 112 nm; 1500 keV; 65 meV; 700 degC; InAs-InAlGaAs-InP; InAs/InAlGaAs/InP dots-in-well laser; bandgap shift; dielectric cap annealing; intermixing; luminescence; nitrogen implantation; point defects; vacancy; Annealing; Dielectrics; Indium phosphide; Luminescence; Nitrogen; Photonic band gap; Quantum dot lasers; Quantum dots; Quantum well lasers; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
Conference_Location :
Princeton, NJ
Print_ISBN :
0-7803-9558-1
Type :
conf
DOI :
10.1109/ICIPRM.2006.1634166
Filename :
1634166
Link To Document :
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