• DocumentCode
    1980273
  • Title

    Nitrogen Implantation Induced Intermixing in InAs/InAlGaAs/InP Dots-in-Well Laser

  • Author

    Djie, Hery S. ; Wang, Yang ; Ooi, Boon S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Lehigh Univ., Bethlehem, PA
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    270
  • Lastpage
    273
  • Abstract
    Nitrogen implantation has been performed to promote the group-III intermixing in InAs quantum dots embedded in InAlGaAs quantum-well laser structure. A differential bandgap shift as large as 112 nm (65 meV) has been observed after nitrogen implantation at 5times1012 ions/cm2, 1500 keV and annealing at 700degC. The intermixing activation is found to occur at a lower temperature than the typical dielectric cap annealing induced intermixing technique. The implantation induced a vacancy peaks at 1.5 mum above the active region. The point defects diffuse efficiently through the active region during subsequent annealing and induced quantum-dot intermixing with improved luminescence at a relatively low activation annealing temperature
  • Keywords
    III-V semiconductors; aluminium compounds; annealing; energy gap; gallium arsenide; indium compounds; ion implantation; nitrogen; photoluminescence; point defects; quantum well lasers; semiconductor quantum dots; 1.5 mum; 112 nm; 1500 keV; 65 meV; 700 degC; InAs-InAlGaAs-InP; InAs/InAlGaAs/InP dots-in-well laser; bandgap shift; dielectric cap annealing; intermixing; luminescence; nitrogen implantation; point defects; vacancy; Annealing; Dielectrics; Indium phosphide; Luminescence; Nitrogen; Photonic band gap; Quantum dot lasers; Quantum dots; Quantum well lasers; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
  • Conference_Location
    Princeton, NJ
  • Print_ISBN
    0-7803-9558-1
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2006.1634166
  • Filename
    1634166