Title :
Optical Characterization of GalnP Layers
Author :
Moser, M. ; Geng, C. ; Lath, E. ; Scholz, F. ; Schweizer, H.
Author_Institution :
Universitat Stuttgart, Germany
Keywords :
Absorption; Epitaxial growth; Epitaxial layers; Gallium arsenide; Lattices; Optical materials; Optical refraction; Optical variables control; Refractive index; Substrates;
Conference_Titel :
Metalorganic Vapor Phase Epitaxy, 1992. Sixth International Conference
Print_ISBN :
0-87942-652-7
DOI :
10.1109/MOVPE.1992.665021
