DocumentCode :
1981208
Title :
MBE Growth of TlInGaAs/TlInP/InP SCH LDs and Their Laser Operation
Author :
Fujiwara, A. ; Matsumoto, T. ; Krishnamurthy, Dheepak ; Hasegawa, S. ; Asahi, H.
Author_Institution :
ISIR, Osaka Univ.
fYear :
0
fDate :
0-0 0
Firstpage :
426
Lastpage :
428
Abstract :
TlInGaAs/TllnP/InP separate confinement heterostructures (SCHs) were grown by gas-source molecular-beam epitaxy and metal stripe laser diodes (LDs) were fabricated. Temperature variation of electroluminescence peak wavelength was as small as 0.06 nm/K due to the reduced temperature variation of band gap energy of TlInGaAs. Pulsed laser operation was achieved at 77 K - 297 K. Threshold current density for the TlInGaAs/TlInP/InP SCH LD (0.6 kA/cm2 at 77 K) was smaller than that for the TlInGaAs/InP double heterostructure LD (0.8 kA/cm2 at 77 K), which is due to the increased refractive index for TlInP and the improved optical confinement. Temperature variation of main peak wavelength in the lasing spectra was as small as 0.07 nm/K, which is much smaller than those for the InGaAsP/InP Fabry-Perot LDs (0.4 nm/K) and distributed feed-back LDs (0.1 nm/K)
Keywords :
III-V semiconductors; current density; electroluminescence; energy gap; gallium arsenide; indium compounds; molecular beam epitaxial growth; optical pulse generation; refractive index; semiconductor growth; semiconductor lasers; thallium compounds; 77 to 297 K; MBE; TlInGaAs-TlInP-InP; TlInGaAs/TlInP/InP SCH LD; band gap energy; electroluminescence; gas-source molecular-beam epitaxy; metal stripe laser diode; optical confinement; refractive index; separate confinement heterostructure; threshold current density; Diode lasers; Electroluminescence; Gas lasers; Indium phosphide; Molecular beam epitaxial growth; Optical pulses; Photonic band gap; Refractive index; Temperature; Threshold current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials Conference Proceedings, 2006 International Conference on
Conference_Location :
Princeton, NJ
Print_ISBN :
0-7803-9558-1
Type :
conf
DOI :
10.1109/ICIPRM.2006.1634207
Filename :
1634207
Link To Document :
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