Extinction ratio compensation by free carrier injection for a MOS-capacitor microring optical modulator subjected to temperature drifting

Author

Shih, Chih T sung ; Zeng, Zhi Wei ; Chao, Shiuh

Author_Institution

Inst. of Photonics Technol., Nat. Tsing Hua Univ., Hsinchu, Taiwan

fYear

2009

fDate

30-3 Aug. 2009

Firstpage

1

Lastpage

2

Abstract

We have analyzed the temperature stability of a MOS-capacitor microring optical modulator that was designed for critical coupling. We found that free carrier injection through DC bias control can compensate the extinction ratio (ER) drop that was caused by temperature drifting. 0.22degC temperature drifting would drop the ER to 5 dB without DC bias and 8.7 V DC bias could extend the 5 dB limit to 1.86degC temperature drifting.

Keywords

MOS capacitors; infrared spectra; integrated optics; integrated optoelectronics; micro-optics; optical modulation; thermo-optical effects; DC bias control; MOS-capacitor microring optical modulator; critical coupling; dense optoelectronic integration; extinction ratio compensation; free carrier injection; temperature drifting; transmittance spectra; Erbium; Extinction ratio; Optical modulation; Optical refraction; Optical variables control; Optical waveguides; Refractive index; Silicon on insulator technology; Temperature control; Voltage control; MOS capacitors; microring; optical modulator; semiconductor waveguides; silicon on insulator (SOI) technology; silicon photonics;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers & Electro Optics & The Pacific Rim Conference on Lasers and Electro-Optics, 2009. CLEO/PACIFIC RIM '09. Conference on

Conference_Location

Shanghai

Print_ISBN

978-1-4244-3829-7

Electronic_ISBN

978-1-4244-3830-3

Type

conf

DOI

10.1109/CLEOPR.2009.5292625

Filename

5292625