Title :
Detection of defective sensor elements using ΣΔ-modulation and a matched filter
Author :
Weiler, D. ; Machul, O. ; Hammerschmidt, D. ; Hosticka, B.J.
Author_Institution :
Fraunhofer Inst. for Microelectron. Circuits & Syst., Duisburg, Germany
Abstract :
We present an integrable solution for the detection of defective sensor elements using sigma-delta-(ΣΔ)-modulation and a matched filter. The sensor element is stimulated using a pseudo random binary sequence (PRBS). The sensor signal is read out and the analog output is digitized using a ΣΔ-modulator. The binary pulse density stream of the ΣΔ-modulator is the output of the sensor system and thus should ideally contain the PRBS. A matched filter has the task of detecting the pseudo random sequence in the pulse density stream and its sampled output is compared to a threshold thus making it possible to judge the functionality of the sensor element. By evaluating the magnitude of the matched filter output it is also possible to measure the sensor sensitivity. We present a discrete solution of this method, but an integrated chip using a standard 1.2 μm CMOS process has been designed and is being fabricated
Keywords :
CMOS integrated circuits; error detection; fault location; intelligent sensors; matched filters; sensitivity; sigma-delta modulation; temperature sensors; ΣΔ-modulation; 1.2 micron; CMOS integrated chip; PRBS stimulation; binary pulse density stream; defective sensor elements detection; integrable solution; matched filter; pseudo random binary sequence; sampled output comparison; sensor sensitivity; sigma-delta modulation; smart sensor system; Error correction; Fault detection; Intelligent sensors; Matched filters; Mathematical model; Redundancy; Safety; Sensor systems; System performance; Temperature sensors;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
DOI :
10.1109/DATE.2000.840846