DocumentCode :
1981514
Title :
VHDL implementation of BIST controller
Author :
Jamuna, S. ; Agrawal, Vinod Kumar
Author_Institution :
Dept. of ECE, PES Inst. of Technol., Bangalore, India
fYear :
2011
fDate :
14-15 Nov. 2011
Firstpage :
188
Lastpage :
190
Abstract :
Built-in self-test (BIST) is a design technique that allows a circuit to test itself It is a set of structured-test techniques for combinational and sequential logic, memories, multipliers and other embedded logic blocks. The principle is to generate test vectors, apply them to the circuit under test or device under test, and then verify the response. Being an automated testing, BIST enables testing at high speed and high fault coverage. BIST controller coordinates the operations of different blocks of the BIST. Based on the test mode(TM) input to the controller, the system either operates in the normal mode or in the test mode. In this paper we explain an implementation of a restart able logic BIST controller for a combinational logic circuit using VHDL. It allows us to suspend the signature generation at any desired point in the test sequence. In this case, the BIST circuit is considered to comprise hold logic and a signature generation element. The hold logic will be implemented such that an external signal (HOED) can temporarily suspend signature generation in the signature generation element at specified times during the BIST session.
Keywords :
built-in self test; combinational circuits; hardware description languages; logic testing; VHDL; automated testing; built-in self-test; circuit testing; combinational logic circuit; design technique; embedded logic block; fault coverage testing; hold logic; memories; multipliers; restart able logic BIST controller; sequential logic; signature generation element; structured-test techniques; test vector generation; BIST; DFT; LFSR; MISR; PRPG;
fLanguage :
English
Publisher :
iet
Conference_Titel :
Advances in Recent Technologies in Communication and Computing (ARTCom 2011), 3rd International Conference on
Conference_Location :
Bangalore
Type :
conf
DOI :
10.1049/ic.2011.0077
Filename :
6193566
Link To Document :
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