• DocumentCode
    1981514
  • Title

    VHDL implementation of BIST controller

  • Author

    Jamuna, S. ; Agrawal, Vinod Kumar

  • Author_Institution
    Dept. of ECE, PES Inst. of Technol., Bangalore, India
  • fYear
    2011
  • fDate
    14-15 Nov. 2011
  • Firstpage
    188
  • Lastpage
    190
  • Abstract
    Built-in self-test (BIST) is a design technique that allows a circuit to test itself It is a set of structured-test techniques for combinational and sequential logic, memories, multipliers and other embedded logic blocks. The principle is to generate test vectors, apply them to the circuit under test or device under test, and then verify the response. Being an automated testing, BIST enables testing at high speed and high fault coverage. BIST controller coordinates the operations of different blocks of the BIST. Based on the test mode(TM) input to the controller, the system either operates in the normal mode or in the test mode. In this paper we explain an implementation of a restart able logic BIST controller for a combinational logic circuit using VHDL. It allows us to suspend the signature generation at any desired point in the test sequence. In this case, the BIST circuit is considered to comprise hold logic and a signature generation element. The hold logic will be implemented such that an external signal (HOED) can temporarily suspend signature generation in the signature generation element at specified times during the BIST session.
  • Keywords
    built-in self test; combinational circuits; hardware description languages; logic testing; VHDL; automated testing; built-in self-test; circuit testing; combinational logic circuit; design technique; embedded logic block; fault coverage testing; hold logic; memories; multipliers; restart able logic BIST controller; sequential logic; signature generation element; structured-test techniques; test vector generation; BIST; DFT; LFSR; MISR; PRPG;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Advances in Recent Technologies in Communication and Computing (ARTCom 2011), 3rd International Conference on
  • Conference_Location
    Bangalore
  • Type

    conf

  • DOI
    10.1049/ic.2011.0077
  • Filename
    6193566