DocumentCode
1981828
Title
Multi-node static logic implications for redundancy identification
Author
Gulrajani, Kabir ; Hsiao, Michael S.
Author_Institution
Intel Corp., Dupont, WA, USA
fYear
2000
fDate
2000
Firstpage
729
Lastpage
733
Abstract
This paper presents a method for redundancy identification (RID) using multi-node logic implications. The algorithm discovers a large number of direct and indirect implications by extending single node implications to multiple nodes. The large number of implications found by multi-node implication method introduces a new redundancy identification technique. Our approach uses an effective node-pair selection method which is O(n) in the number of nodes to reduce execution time, and it can be used as an efficient preprocessing phase for test generation. Application of these multi-node static logic implications uncovered more redundancies in ISCAS85 combinational circuits than previous single-node methods without excessive computational effort
Keywords
circuit analysis computing; combinational circuits; logic testing; redundancy; combinational circuits; multi-node static logic; node-pair selection method; preprocessing phase; redundancy identification; test generation; Algebra; Automatic test pattern generation; Circuit faults; Circuit testing; Combinational circuits; Computational efficiency; Fault diagnosis; Fires; Logic functions; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location
Paris
Print_ISBN
0-7695-0537-6
Type
conf
DOI
10.1109/DATE.2000.840868
Filename
840868
Link To Document