Title :
Mixed-signal BIST using correlation and reconfigurable hardware
Author :
da Silva, J. Machado ; Duarte, J.S. ; Matos, J.S.
Author_Institution :
Porto Univ., Portugal
Abstract :
Reducing the area overhead required by BIST structures can be achieved by reconfiguring existing hardware to perform test related control and processing functions. This work shows how the resources required for these operations can be implemented in-circuit, taking advantage of programmable logic available in the system. Structural and functional tests are performed using correlation to obtain iDD and νOUT cross-correlation signatures, and to measure gain, phase, and total harmonic distortion
Keywords :
built-in self test; correlation methods; harmonic distortion; integrated circuit testing; mixed analogue-digital integrated circuits; programmable logic devices; reconfigurable architectures; area overhead; cross-correlation signatures; functional tests; mixed-signal BIST; programmable logic; reconfigurable hardware; structural tests; total harmonic distortion; Built-in self-test; Distortion measurement; Gain measurement; Hardware; Performance evaluation; Process control; Programmable logic arrays; Programmable logic devices; Reconfigurable logic; Testing;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
Conference_Location :
Paris
Print_ISBN :
0-7695-0537-6
DOI :
10.1109/DATE.2000.840877
