• DocumentCode
    1981982
  • Title

    Mixed-signal BIST using correlation and reconfigurable hardware

  • Author

    da Silva, J. Machado ; Duarte, J.S. ; Matos, J.S.

  • Author_Institution
    Porto Univ., Portugal
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    744
  • Abstract
    Reducing the area overhead required by BIST structures can be achieved by reconfiguring existing hardware to perform test related control and processing functions. This work shows how the resources required for these operations can be implemented in-circuit, taking advantage of programmable logic available in the system. Structural and functional tests are performed using correlation to obtain iDD and νOUT cross-correlation signatures, and to measure gain, phase, and total harmonic distortion
  • Keywords
    built-in self test; correlation methods; harmonic distortion; integrated circuit testing; mixed analogue-digital integrated circuits; programmable logic devices; reconfigurable architectures; area overhead; cross-correlation signatures; functional tests; mixed-signal BIST; programmable logic; reconfigurable hardware; structural tests; total harmonic distortion; Built-in self-test; Distortion measurement; Gain measurement; Hardware; Performance evaluation; Process control; Programmable logic arrays; Programmable logic devices; Reconfigurable logic; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings
  • Conference_Location
    Paris
  • Print_ISBN
    0-7695-0537-6
  • Type

    conf

  • DOI
    10.1109/DATE.2000.840877
  • Filename
    840877
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1981982