• DocumentCode
    1982006
  • Title

    Characterization of Interface Structure in GalnAs/lnP Superlattices by means of X-Ray Diffraction

  • Author

    Meyer, R. ; Hollfelder, M. ; Hardtdegen, H. ; Lengeler, B. ; Lüth, H.

  • Author_Institution
    Institut fur Schicht- und Ionentechnik, Julich
  • fYear
    1992
  • fDate
    8-11 Jun 1992
  • Firstpage
    234
  • Lastpage
    235
  • Keywords
    Bonding; Crystallization; Indium phosphide; Intersymbol interference; Optical devices; Optical diffraction; Optical materials; Optical sensors; Optical superlattices; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Metalorganic Vapor Phase Epitaxy, 1992. Sixth International Conference
  • Print_ISBN
    0-87942-652-7
  • Type

    conf

  • DOI
    10.1109/MOVPE.1992.665032
  • Filename
    665032
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1982006