DocumentCode :
1982006
Title :
Characterization of Interface Structure in GalnAs/lnP Superlattices by means of X-Ray Diffraction
Author :
Meyer, R. ; Hollfelder, M. ; Hardtdegen, H. ; Lengeler, B. ; Lüth, H.
Author_Institution :
Institut fur Schicht- und Ionentechnik, Julich
fYear :
1992
fDate :
8-11 Jun 1992
Firstpage :
234
Lastpage :
235
Keywords :
Bonding; Crystallization; Indium phosphide; Intersymbol interference; Optical devices; Optical diffraction; Optical materials; Optical sensors; Optical superlattices; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Metalorganic Vapor Phase Epitaxy, 1992. Sixth International Conference
Print_ISBN :
0-87942-652-7
Type :
conf
DOI :
10.1109/MOVPE.1992.665032
Filename :
665032
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1982006
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