DocumentCode :
1982128
Title :
An Integrated Scattering- and Noise Parameter Measurement System
Author :
Beuwer, W.A.M.
Author_Institution :
Twente University of Technology, EL/Microwave Department, P.O. Box 217, 7500 AE ENSCHEDE (Netherlands)
fYear :
1981
fDate :
7-11 Sept. 1981
Firstpage :
627
Lastpage :
632
Abstract :
By addition of noise measuring equipment to an existing semi-automatic Network Analyser System, Scattering and Noise Parameters of linear two-ports can now accurately be measured in a relative easy and fast way, over a frequency band from 1,8 - 18 GHz. To reach this goal an HP9845B desktop computer is used to guide the operator, control the equipment, gather and correct the data and present the results. Essential for the broadband noise parameter measurements is a computer controlled, stepper-motor driven, coaxial slide screw-tuner. A block-diagram of the whole system, that is placed in a temperature stabilized room (22 ± l°C), is given in fig. 4.
Keywords :
Circuit noise; Frequency measurement; Harmonic analysis; Impedance measurement; Noise measurement; Scattering parameters; Signal analysis; Signal to noise ratio; Temperature; Tuners;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1981. 11th European
Conference_Location :
Amsterdam, Netherlands
Type :
conf
DOI :
10.1109/EUMA.1981.332917
Filename :
4131686
Link To Document :
بازگشت