DocumentCode
1982243
Title
Further Investigation into the Electromagnetic Susceptibility of an EBG Microstrip Filter
Author
Lee, Yee Hui ; Huang, Shao Ying
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
fYear
2007
fDate
11-14 Dec. 2007
Firstpage
1
Lastpage
4
Abstract
In a dual-plane compact electromagnetic band-gap (C-EBG) microstrip structure, patches are etched periodically in the ground plane to prohibit the propagation of electromagnetic waves in certain frequency bands so as to provide filtering functionality. However, the existence of the etched patches in the ground plane becomes a natural concern. These structures might be more prone to electromagnetic interference from nearby radiating components as compare to a microstrip filter with a perfect ground plane. In this paper, a further investigation into the electromagnetic susceptibility of a C-EBG filter structure is presented as a continued work of the previous ones [1] [2]. This study examines the coupling and crosstalk effects of a coplanar microstrip line on the performance of a C-EBG structure. It includes the effect of the relative power level, direction of transmission of signals, and the relative position. From the study, useful guidelines are drawn for the applications of EBG microstrip structures in an environment rich in electromagnetic interference.
Keywords
electromagnetic compatibility; microstrip filters; microstrip lines; photonic band gap; EBG microstrip filter; coplanar microstrip line; crosstalk effect; dual-plane compact electromagnetic band-gap; electromagnetic interference; electromagnetic susceptibility; Electromagnetic interference; Electromagnetic propagation; Electromagnetic scattering; Etching; Filtering; Frequency; Metamaterials; Microstrip components; Microstrip filters; Periodic structures;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 2007. APMC 2007. Asia-Pacific
Conference_Location
Bangkok
Print_ISBN
978-1-4244-0748-4
Electronic_ISBN
978-1-4244-0749-1
Type
conf
DOI
10.1109/APMC.2007.4555100
Filename
4555100
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