Near-field optical second-harmonic microscopy

Author

Smolyaninov, I.I. ; Lee, C.H. ; Davis, C.C.

Author_Institution

Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA

fYear

1998

fDate

8-8 May 1998

Firstpage

228

Abstract

Summary form only given. We have studied near-field SHG from various samples: rough metal films, LiNbO/sub 3/ waveguide structures, piezoceramics, etc. Image acquisition time has been substantially reduced in comparison with previous work, down to a few tens of minutes. We show images of surface topography and SHG intensity measured simultaneously using the surface of a poled piezoelectric tube as a sample.

Keywords

optical harmonic generation; optical images; optical microscopy; optical waveguides; piezoceramics; surface topography measurement; LiNbO/sub 3/; LiNbO/sub 3/ waveguide structures; SHG intensity measure; image acquisition time; near-field SHG; near-field optical second-harmonic microscopy; piezoceramics; poled piezoelectric tube; rough metal films; surface topography measurement; Optical films; Optical harmonic generation; Optical microscopy; Optical surface waves; Optical waveguides; Piezoelectric films; Piezoelectric materials; Rough surfaces; Surface roughness; Surface topography;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-541-2

Type

conf

DOI

10.1109/IQEC.1998.680483

Filename

680483