• DocumentCode
    1983461
  • Title

    Conductive mechanism and its mathematical model of thick-film strain resistors

  • Author

    Ma, Yiwu ; Chen, Jianqun ; Ding, Peng ; Li, Minqiang

  • Author_Institution
    State Key Lab. of Transducer Technol., Chinese Acad. of Sci., Anhui, China
  • fYear
    2005
  • fDate
    27 June-3 July 2005
  • Abstract
    Some thick-film resistors base on Bi2Ru2O7 were evaluated. The resistors are made by screen-printing thick film paste on Al2O3 substrates. After printing and drying, the thick-film pastes are fired in a belt furnace. We discuss the conduction mechanism and a strain sensitive mathematical model of thick-film resistors through calculating and taking the measurements of the gauge factor (GF). We also interpreted the phenomenon through the strain sensitive model, and explained the strain sensitive phenomenon, such as the GF mounts up with the barrier height´s augmention.
  • Keywords
    bismuth compounds; drying; pressure sensors; ruthenium compounds; substrates; thick film resistors; Al2O3; Bi2Ru2O7; belt furnace; conductive mechanism; gauge factor; screen-printing; strain sensitive mathematical model; substrate; thick film paste; thick-film strain resistor; Belts; Bismuth; Capacitive sensors; Furnaces; Mathematical model; Printing; Resistors; Strain measurement; Substrates; Thick films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Acquisition, 2005 IEEE International Conference on
  • Print_ISBN
    0-7803-9303-1
  • Type

    conf

  • DOI
    10.1109/ICIA.2005.1635058
  • Filename
    1635058