• DocumentCode
    1983696
  • Title

    Long Residue Checking for Adders

  • Author

    Sullivan, Michael B. ; Swartzlander, Earl E., Jr.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2012
  • fDate
    9-11 July 2012
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    As system sizes grow and devices become more sensitive to faults, adder protection may be necessary to achieve system error-rate bounds. This study investigates a novel fault detection scheme for fast adders, long residue checking (LRC), which has substantive advantages over all previous separable approaches. Long residues are found to provide a ~10% reduction in complexity and ~25% reduction in power relative to the next most efficient error detector, while remaining modular and easy to implement.
  • Keywords
    adders; circuit complexity; error detection codes; fault diagnosis; logic testing; LRC; adder protection; complexity reduction; error detector; fault detection scheme; long residue checking; system error-rate bound; Adders; Complexity theory; Computers; Delay; Libraries; Pipelines; Standards; Adder; lazy checker; long residue checker (LRC); residue checking; self-testing and self-checking circuitry; standard cell synthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Application-Specific Systems, Architectures and Processors (ASAP), 2012 IEEE 23rd International Conference on
  • Conference_Location
    Delft
  • ISSN
    2160-0511
  • Print_ISBN
    978-1-4673-2243-0
  • Electronic_ISBN
    2160-0511
  • Type

    conf

  • DOI
    10.1109/ASAP.2012.31
  • Filename
    6341472