• DocumentCode
    1984676
  • Title

    Embedded e-diagnostic for distributed industrial machinery

  • Author

    Hui, Tsz Ming James ; Brown, David J. ; Haynes, Barry ; Wang, Xunxian

  • Author_Institution
    Intelligent Syst. & Diagnostic Res. Group, Portsmouth Univ., UK
  • fYear
    2003
  • fDate
    29-31 July 2003
  • Firstpage
    156
  • Lastpage
    161
  • Abstract
    Industrial process machine failure often causes severe financial implications. This is compounded by the lack of availability of experts and the complications of getting them to site. One solution is to give the expert access to the machine remotely with the addition of an Artificial Intelligence (AI) based diagnostics software to assist with the decision making process. Our research is based on such a system, which combines modern communications with intelligent diagnostics software. Accessibility to process machines can now be global with the promise of predictability to the diagnosis. It is felt the importance of this research work cannot be overstated with the constantly moving worldwide manufacturing base and the real situation of the machine designers being based in a different country to their customer. The most vulnerable areas of a machine are its parts that consist of electro-mechanical actuation. The author utilises conventional Newtonian physics and differential calculus to model these and an AI technique of fault prediction and detection.
  • Keywords
    Internet; diagnostic expert systems; distributed decision making; embedded systems; failure analysis; fault diagnosis; production equipment; Newtonian physics; artificial intelligence; decision making process; differential calculus; distributed industrial machinery; electro-mechanical actuation; embedded e-diagnostic; fault detection; fault prediction; financial implications; industrial process machine failure; intelligent diagnostics software; machine designers; worldwide manufacturing; Artificial intelligence; Calculus; Communication system software; Decision making; Fault detection; Machine intelligence; Machinery; Manufacturing; Physics; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Intelligence for Measurement Systems and Applications, 2003. CIMSA '03. 2003 IEEE International Symposium on
  • Print_ISBN
    0-7803-7783-4
  • Type

    conf

  • DOI
    10.1109/CIMSA.2003.1227220
  • Filename
    1227220