DocumentCode :
1985129
Title :
Microwave Moisture Measurements with Reduced Sensitivity to Particle Size and Shape
Author :
Klein, A. ; Schicker, W. ; Schiek, B.
Author_Institution :
Bergbau-Forschung GmbH, 4300 Essen, Federal Republic of Germany
fYear :
1982
fDate :
13-17 Sept. 1982
Firstpage :
593
Lastpage :
598
Abstract :
For the determination of moisture content the disturbing influences of particle size and shape can be reduced by a combined evaluation of the real and imaginary part of the dielectric constant. However the suggested formula is sensitive to the dielectric constant of the dry material, which can be determined only indirectly.
Keywords :
Dielectric constant; Dielectric materials; Dielectric measurements; Equations; Microwave measurements; Moisture measurement; Particle measurements; Shape measurement; Size measurement; Water;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1982. 12th European
Conference_Location :
Helsinki, Finland
Type :
conf
DOI :
10.1109/EUMA.1982.333125
Filename :
4131830
Link To Document :
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