• DocumentCode
    1985357
  • Title

    Input and output encoding techniques for on-line error detection in combinational logic circuits

  • Author

    Busaba, Fadi Y. ; Lala, Parag K.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
  • fYear
    1993
  • fDate
    6-8 April 1993
  • Firstpage
    48
  • Lastpage
    54
  • Abstract
    Presents techniques for designing arbitrary combinational circuits so that any single stuck-at fault will result in either single bit error or unidirectional multibit errors at the output. An input encoding algorithm and an output encoding algorithm that ensure that every fault at the input will either produce single bit error or unidirectional multibit errors at the output are proposed. If there are no input faults which produce bidirectional error, no internal stuck-at fault will result in such an error irrespective of the way the circuit is implemented. The proposed techniques have been applied to MCNC benchmark circuits and the overhead is estimated.<>
  • Keywords
    VLSI; combinatorial circuits; encoding; error detection codes; fault location; MCNC benchmark circuits; combinational logic circuits; input encoding algorithm; on-line error detection; output encoding algorithm; overhead; single bit error; stuck-at fault; unidirectional multibit errors; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Computer errors; Condition monitoring; Electrical fault detection; Encoding; Fault detection; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-8186-3830-3
  • Type

    conf

  • DOI
    10.1109/VTEST.1993.313309
  • Filename
    313309