• DocumentCode
    1985794
  • Title

    SNR measurement based on linearity test for ADC BIST

  • Author

    Duan, Jingbo ; Chen, Degang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • fYear
    2011
  • fDate
    15-18 May 2011
  • Firstpage
    269
  • Lastpage
    272
  • Abstract
    Linearity and spectral performance test contributes most cost of ADC test. This paper presents a new method for testing an ADC´s SNR from its linearity test data. The method does not require additional data acquisition or accurate sinusoidal stimulus. Data collected for linearity test is used to compute the input noise power and test ADC´s SNR. Both simulation and experimental results show that the proposed method can estimate SNR value accurately.
  • Keywords
    analogue-digital conversion; built-in self test; ADC BIST; ADC test; SNR measurement; data acquisition; linearity test; sinusoidal stimulus; spectral performance test; Built-in self-test; Histograms; Linearity; Random variables; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4244-9473-6
  • Electronic_ISBN
    0271-4302
  • Type

    conf

  • DOI
    10.1109/ISCAS.2011.5937553
  • Filename
    5937553
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1985794