Title :
Controllability and observability measures for functional-level testability evaluation
Author :
Jamoussi, M. ; Kaminska, B.
Author_Institution :
Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada
Abstract :
An approach of a functional-level testability evaluation, based on controllability and observability measures (c.o.m.), is proposed. Using Rutman´s system model, ordinary applied at the gate level, c.o.m are extended to the data-path level, to permit incorporation of testability constraints in the high-level synthesis stage. The approach of computing these c.o.m. is based on the reduced ordered binary decision diagram (ROBDD) circuit representation. It is shown how to identify untestable parts of a data path and how to evaluate its test cost. The insertion of a two-variable multiplexor, as a structural modification in the data path, is suggested to improve the c.o.m., and so, the test cost. To evaluate the impact of this transformation on the data-path testability, an objective function is proposed, appropriate for high-level synthesis.<>
Keywords :
automatic testing; controllability; integrated logic circuits; large scale integration; logic testing; observability; Rutman´s system model; controllability; data-path level; functional-level testability evaluation; objective function; observability measures; reduced ordered binary decision diagram; test cost; testability constraints; two-variable multiplexor; Boolean functions; Circuit testing; Controllability; Costs; Data structures; Electric variables measurement; High level synthesis; Observability; System testing; Wire;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313332