Title :
On the design for testability of sequential circuits
Author :
Sun, X. ; Lombardi, F.
Author_Institution :
Texas A&M Univ., Dept. of Comput. Sci., College Station, TX, USA
Abstract :
Presents a new approach for design-for-testability (DFT) of sequential circuits. The proposed approach is based on augmenting the system under test (SUT) with additional circuitry such that the combinational part of the SUT and the sequential part (i.e. the flip-flops) can be tested independently (disjoint testing).<>
Keywords :
design for testability; flip-flops; logic testing; sequential circuits; design for testability; disjoint testing; flip-flops; sequential circuits; system under test; Circuit testing; Combinational circuits; Controllability; Design for testability; Observability; Sequential analysis; Sequential circuits; Sun; System testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location :
Atlantic City, NJ, USA
Print_ISBN :
0-8186-3830-3
DOI :
10.1109/VTEST.1993.313334
