• DocumentCode
    1985902
  • Title

    Testability preserving Boolean transforms for logic synthesis

  • Author

    Kundu, S. ; Pramanick, A.K.

  • Author_Institution
    IBM Res. Div., Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    1993
  • fDate
    6-8 April 1993
  • Firstpage
    131
  • Lastpage
    138
  • Abstract
    Synthesis proceeds through local transformations with various objectives. If testability is a concern, these transformations are limited to those that preserve or enhance testability. Such transformations are called testability preserving transformations. The fault model used is pivotal to the analysis of any such transformation. In this paper, the authors chose single-path-propagating hazard-free robust delay fault testability to qualify them. This model was chosen because it disambiguates results of delay testing which are often inconclusive (the presence of a fault can neither be ascertained nor be denied) and ensures stuck-at fault testability as well. Unfortunately, only a few transformations are known to obey testability requirements. This limitation is a serious handicap in attaining other synthesis goals such as area and performance optimization. In this paper the authors establish a relationship between testability properties of logic transformations and their Boolean duals, the application of which enlarges the existing number of testability preserving transforms. They demonstrate further that some of the new transformations thus achieved may actually enhance testability.<>
  • Keywords
    Boolean functions; VLSI; fault location; logic CAD; Boolean duals; Boolean transforms; fault model; local transformations; logic synthesis; single-path-propagating hazard-free robust delay fault testability; stuck-at fault testability; testability; testability preserving transformations; Automatic testing; Boolean functions; Circuit faults; Circuit synthesis; Circuit testing; Delay; Logic testing; Robustness; Test pattern generators; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-8186-3830-3
  • Type

    conf

  • DOI
    10.1109/VTEST.1993.313336
  • Filename
    313336