DocumentCode
1985902
Title
Testability preserving Boolean transforms for logic synthesis
Author
Kundu, S. ; Pramanick, A.K.
Author_Institution
IBM Res. Div., Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
1993
fDate
6-8 April 1993
Firstpage
131
Lastpage
138
Abstract
Synthesis proceeds through local transformations with various objectives. If testability is a concern, these transformations are limited to those that preserve or enhance testability. Such transformations are called testability preserving transformations. The fault model used is pivotal to the analysis of any such transformation. In this paper, the authors chose single-path-propagating hazard-free robust delay fault testability to qualify them. This model was chosen because it disambiguates results of delay testing which are often inconclusive (the presence of a fault can neither be ascertained nor be denied) and ensures stuck-at fault testability as well. Unfortunately, only a few transformations are known to obey testability requirements. This limitation is a serious handicap in attaining other synthesis goals such as area and performance optimization. In this paper the authors establish a relationship between testability properties of logic transformations and their Boolean duals, the application of which enlarges the existing number of testability preserving transforms. They demonstrate further that some of the new transformations thus achieved may actually enhance testability.<>
Keywords
Boolean functions; VLSI; fault location; logic CAD; Boolean duals; Boolean transforms; fault model; local transformations; logic synthesis; single-path-propagating hazard-free robust delay fault testability; stuck-at fault testability; testability; testability preserving transformations; Automatic testing; Boolean functions; Circuit faults; Circuit synthesis; Circuit testing; Delay; Logic testing; Robustness; Test pattern generators; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-8186-3830-3
Type
conf
DOI
10.1109/VTEST.1993.313336
Filename
313336
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