DocumentCode
1985988
Title
GaAs-AlGaAs Epitaxial Growth for Microwave Applications
Author
Linh, Nuyen T.
Author_Institution
THOMSON - CSF Central Research Laboratory, Domaineue Corbeville - 91401 - ORSAY (FRANCE)
fYear
1983
fDate
3-8 Sept. 1983
Firstpage
34
Lastpage
43
Abstract
Heterojunctions which have been used for years in optoelectronic devices, are now entering in microwave applications. The heterojunction bipolar transistor, proposed since 1957 in not matured in its technology. The new born selectively-doped heterojunction (1978) is gaining in interest in both aspects, physics of the two-dimensional electron-gas (2DEG) and electronic applications. This paper will first recall the transport properties of the 2DEG accumulated at the interface of undoped GaAs-n doped A1GaAs heterunctions. In particular, extremely high mobility and high electron velocity were observed. Growth of these selectively doped heterojunctions by MBE and MOCVD is then described. The best results were obtained by the former technique. Low-noise two-dimensional electron gas FETs (TEGFETs) are presented. With gate length of ~ 0.5¿m noise figure as low as 1.26, 1.4 and 2.3 dB were measured at 10, 12 and 17.5 GHz respectively, with associated gain of 12, 11 and 7.1 dB. The TEGFET have been shown to be the fastest semiconductor device at 300 K with 12.2ps (gate length ~1¿m). They also present low power dissipation (5 times less than conventional GaAs FETs). TEGFET frequency dividers operate up to 5.5 GHz (gate length ~l¿m).
Keywords
Electron mobility; Epitaxial growth; HEMTs; Heterojunction bipolar transistors; MOCVD; MODFETs; Microwave devices; Molecular beam epitaxial growth; Optoelectronic devices; Physics;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1983. 13th European
Conference_Location
Nurnberg, Germany
Type
conf
DOI
10.1109/EUMA.1983.333208
Filename
4131870
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