• DocumentCode
    1986224
  • Title

    Numerical study on field effect MOS transistor detection response to modulated terahertz radiation signal

  • Author

    Wang, Yinglei ; Yan, Zhifeng ; Zhu, Jingxuan ; Lin, Xinnan ; He, Frank

  • Author_Institution
    Shenzhen Grad. Sch., Key Lab. of Integrated Microsyst., Peking Univ., Shenzhen, China
  • fYear
    2009
  • fDate
    22-24 Dec. 2009
  • Firstpage
    475
  • Lastpage
    478
  • Abstract
    The detector response characteristics of the field effect MOS transistor (MOSFET) to modulated terahertz radiation signal are studied in detail in this paper by a numerical simulation program developed from the basic hydrodynamic equations which govern the terahertz signal transport in the MOSFET and a universal MOSFET charge density equation which makes this program suitable in a wide range of operation region of MOSFET terahertz detector. The simulation results agree well with the existing theory which is only suitable in the nonresonant region. The developed numerical simulation program is also used to analyze the photoresponse characteristics of the MOSFET detector to modulated terahertz radiation in the resonant region, demonstrating potential application in the detector design and optimization from a MOSFET.
  • Keywords
    MOSFET; submillimetre wave detectors; MOSFET terahertz detector; charge density equation; detector response characteristic; field effect MOS transistor; hydrodynamic equation; modulated terahertz radiation signal; photoresponse characteristic; Electromagnetic radiation; Equations; FETs; Frequency; MOSFET circuits; Numerical simulation; Optical modulation; Radiation detectors; Resonance; Voltage; MOSFET; electronic photo devices; modulated terahertz radiation; numerical simulation; terahertz detector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
  • Conference_Location
    Varanasi
  • Print_ISBN
    978-1-4244-4846-3
  • Type

    conf

  • DOI
    10.1109/ELECTRO.2009.5441062
  • Filename
    5441062