• DocumentCode
    1986299
  • Title

    Photoconductivity, dark-conductivity and photoluminescence study of hydrothermally synthesized ZnO nanoparticles

  • Author

    Mishra, Sheo K. ; Srivastava, Rajneesh K. ; Prakash, S.G. ; Yadav, Raghvendra S. ; Panday, A.C.

  • Author_Institution
    Dept. of Electron. & Commun., Univ. of Allahabad, Allahabad, India
  • fYear
    2009
  • fDate
    22-24 Dec. 2009
  • Firstpage
    461
  • Lastpage
    464
  • Abstract
    In the present work, we report on the photoconductivity (PC), dark-conductivity and photoluminescence (PL) measurements of hydrothermally synthesized Zinc oxide (ZnO) nanoparticles (NPs) with particle size 20-50 nm. The photoconductivity is observed in ZnO nanoparticles due to photoexcitation in the visible range (400 nm-691 nm). The photo and dark conductivity of ZnO NPs have been measured using thick film of powder with out any binder. The photo and dark current behavior as a function of various parameters such as field response, rise and decay time response was studied. The photocurrent (Ipc) and dark-current (Idc) follows power law with applied field, Ipc ?? Vr due to the defect related mechanism including both recombination centers and traps. The ZnO NPs is found to have deep trap of 0.72 eV. The photoluminescence spectra of synthesized ZnO nanoparticles exhibited different emission peaks at 396 nm, 416 nm, 445 nm, 481 nm and 524 nm.
  • Keywords
    II-VI semiconductors; dark conductivity; electron-hole recombination; nanofabrication; nanoparticles; particle size; photoconductivity; photoexcitation; photoluminescence; semiconductor growth; wide band gap semiconductors; zinc compounds; ZnO; dark-conductivity; hydrothermally synthesized nanoparticles; particle size; photoconductivity; photocurrent; photoexcitation; photoluminescence; recombination centers; size 20 nm to 50 nm; traps; visible spectra; wavelength 400 nm to 691 nm; Conductivity measurement; Nanoparticles; Particle measurements; Photoconductivity; Photoluminescence; Powders; Size measurement; Thick films; Thickness measurement; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
  • Conference_Location
    Varanasi
  • Print_ISBN
    978-1-4244-4846-3
  • Type

    conf

  • DOI
    10.1109/ELECTRO.2009.5441066
  • Filename
    5441066