• DocumentCode
    1986333
  • Title

    Pattern generator card, emulation, and debug

  • Author

    Dunn, Stephcn M. ; Balazich, D.G. ; Lange, Lawrence K. ; Montillo, Charlotte C.

  • Author_Institution
    IBM Corp., Hopewell Junction, NY, USA
  • fYear
    1993
  • fDate
    6-8 April 1993
  • Firstpage
    358
  • Lastpage
    360
  • Abstract
    Details a pattern generator card used in a high speed VLSI test system, a software emulation of that card, and card debug procedure. The Advanced Test System built at IBM East Fishkill contains primarily pin electronics cards, pattern generator cards, and power and clock distribution cards. The software emulator, called PGEM, for pattern generator emulation, serves two major purposes: it facilitates off-line debug of pattern generator cards; and, when used with a waveform tool, it permits verification of test programs without wasting system time. The simplification of off-line debug is important in terms of time savings and reduction of expensive incorrect diagnoses.<>
  • Keywords
    VLSI; automatic test equipment; boundary scan testing; development systems; integrated circuit testing; card debug procedure; clock distribution cards; high speed VLSI test system; off-line debug; pattern generator card; pin electronics cards; software emulation; time savings; waveform tool; Clocks; Electronic equipment testing; Emulation; Power generation; Software debugging; Software systems; Software testing; System testing; Test pattern generators; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
  • Conference_Location
    Atlantic City, NJ, USA
  • Print_ISBN
    0-8186-3830-3
  • Type

    conf

  • DOI
    10.1109/VTEST.1993.313379
  • Filename
    313379