DocumentCode
1986333
Title
Pattern generator card, emulation, and debug
Author
Dunn, Stephcn M. ; Balazich, D.G. ; Lange, Lawrence K. ; Montillo, Charlotte C.
Author_Institution
IBM Corp., Hopewell Junction, NY, USA
fYear
1993
fDate
6-8 April 1993
Firstpage
358
Lastpage
360
Abstract
Details a pattern generator card used in a high speed VLSI test system, a software emulation of that card, and card debug procedure. The Advanced Test System built at IBM East Fishkill contains primarily pin electronics cards, pattern generator cards, and power and clock distribution cards. The software emulator, called PGEM, for pattern generator emulation, serves two major purposes: it facilitates off-line debug of pattern generator cards; and, when used with a waveform tool, it permits verification of test programs without wasting system time. The simplification of off-line debug is important in terms of time savings and reduction of expensive incorrect diagnoses.<>
Keywords
VLSI; automatic test equipment; boundary scan testing; development systems; integrated circuit testing; card debug procedure; clock distribution cards; high speed VLSI test system; off-line debug; pattern generator card; pin electronics cards; software emulation; time savings; waveform tool; Clocks; Electronic equipment testing; Emulation; Power generation; Software debugging; Software systems; Software testing; System testing; Test pattern generators; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1993. Digest of Papers., Eleventh Annual 1993 IEEE
Conference_Location
Atlantic City, NJ, USA
Print_ISBN
0-8186-3830-3
Type
conf
DOI
10.1109/VTEST.1993.313379
Filename
313379
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