• DocumentCode
    1986506
  • Title

    Development and cold testing of vacuum RF window for C band 250 kW CW power klystron

  • Author

    Lamba, O.S. ; Kaushik, Meenu ; Kumar, Sushil ; Jindal, Vishnu ; Singh, Vijay ; Ratan, Shilpam ; Pal, Debasish ; Kant, D. ; Joshi, L.M.

  • Author_Institution
    Central Electron. Eng. Res. Inst. Pilani(Rajasthan), Council of Sci. & Ind. Res., New Delhi, India
  • fYear
    2009
  • fDate
    22-24 Dec. 2009
  • Firstpage
    429
  • Lastpage
    431
  • Abstract
    The paper deals with the design fabrication and cold testing of vacuum RF window for C-band 250 kW CW power klystron. The simulation of the window has been carried out using the CST microwave studio software. The proposed window is designed for 5 GHz operating frequency for handling 250 kW of RF power. In the proposed window geometry, metallized alumina disc (99.5 % purity) of diameter 56 mm and thickness 1.5 mm is brazed in a cylindrical waveguide of diameter 56 mm. The cylindrical waveguide is terminated to WR 187 waveguide at its both ends. The return loss and insertion loss of the above mentioned window has been found to be -48 dB and 0.05 dB respectively which are well matched with experimental values. The bandwidth of 170 MHz was achieved. The window performance has been found satisfactory for microwave transmission.
  • Keywords
    S-parameters; alumina; circular waveguides; klystrons; CST microwave studio software; bandwidth 170 MHz; cold testing; cylindrical waveguide; frequency 5 GHz; metallized alumina disc; microwave transmission; power 250 kW; power klystron; size 1.5 mm; size 56 mm; vacuum RF window; Bandwidth; Dielectric constant; Dielectric losses; Electronic equipment testing; Insertion loss; Klystrons; Microwave devices; Radio frequency; Scattering parameters; Vacuum systems; Klystron; RF Window; S - parameters; alumina; pill-box type;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
  • Conference_Location
    Varanasi
  • Print_ISBN
    978-1-4244-4846-3
  • Type

    conf

  • DOI
    10.1109/ELECTRO.2009.5441074
  • Filename
    5441074