DocumentCode
1986567
Title
Dispersion Characteristics in FIN Lines with One and Two Dielectric Layers Arbitrarily Located in the Waveguide
Author
Fernandes, Humberto César Chaves ; Giarola, Attílio José
Author_Institution
Electrical Engineering Department, Universidade Estadual de Campinas (UNICAMP), C.P. 1170, 13100 Campinas, SP., Brazil.
fYear
1983
fDate
3-8 Sept. 1983
Firstpage
272
Lastpage
277
Abstract
Using an efficient method of analysis the dispersion characteristics in new unilateral fin-line structures have been obtained. It consists of using an equivalent transmission line theory in the spectral domain of the Fourier transform with the moment method. The analysis is general and may be applied to a variety of structures. Numerical results are obtained for unilateral fin lines with one and two dielectric layers located symmetrically or asymmetrically in the E-plane of the waveguide.
Keywords
Dielectrics; Eigenvalues and eigenfunctions; Fabrication; Finline; Fourier transforms; Moment methods; Propagation constant; Tellurium; Transmission line matrix methods; Transmission line theory;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1983. 13th European
Conference_Location
Nurnberg, Germany
Type
conf
DOI
10.1109/EUMA.1983.333239
Filename
4131901
Link To Document