DocumentCode :
1986691
Title :
Study of effect of room window on through wall imaging in UWB range
Author :
Gaikwad, Abhay N. ; Singh, Dharmendra ; Nigam, M.J.
Author_Institution :
Dept. of Electron. & Comput. Eng., Indian Inst. of Technol., Roorkee, India
fYear :
2009
fDate :
22-24 Dec. 2009
Firstpage :
395
Lastpage :
398
Abstract :
In through wall imaging (TWI), detection is possible due to dielectric contrasts between target and room environment. Complexity increases if room consists of furniture´s and other objects beside desired target. Further detection of desired target becomes complex with the presence of window in back wall of room. Thus in this paper, effect of presence of window in back wall of room is investigated on detection and imaging. A detection technique is proposed in which signal processing technique is applied to extract the target information from clutter signal. A back projection imaging technique is applied to image the target. For this purpose, indigenously a TWI system based on step frequency continuous wave (SFCW) principle is developed in ultra wide band (UWB) range of frequency (i.e., 3.95 GHz to 5.85 GHz), plywood considered as wall and metallic plate is considered as target behind the plywood wall. The results are quite encouraging.
Keywords :
CW radar; radar clutter; radar imaging; reflection; ultra wideband radar; UWB; back projection imaging technique; clutter signal; detection technique; room window effect; signal processing technique; step frequency continuous wave principle; target information extraction; through wall imaging; ultra wideband; Bandwidth; Clutter; Data mining; Frequency; Object detection; Radar imaging; Signal processing; Signal processing algorithms; Singular value decomposition; Ultra wideband radar; Back projection; singular value decomposition; step frequency continuous wave radar; window effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
Conference_Location :
Varanasi
Print_ISBN :
978-1-4244-4846-3
Type :
conf
DOI :
10.1109/ELECTRO.2009.5441085
Filename :
5441085
Link To Document :
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