DocumentCode :
19868
Title :
Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications
Author :
Sabena, D. ; Sterpone, L. ; Carro, Luigi ; Rech, P.
Author_Institution :
Dipt. di Autom. e Inf. (DAUIN), Politec. di Torino, Turin, Italy
Volume :
61
Issue :
6
fYear :
2014
fDate :
Dec. 2014
Firstpage :
3123
Lastpage :
3129
Abstract :
Thanks to the capability of efficiently executing massive computations in parallel, general purpose graphic processing units (GPGPUs) have begun to be preferred to CPUs for several parallel applications in different domains. Two are the most relevant fields in which, recently, GPGPUs have begun to be employed: high performance computing (HPC) and embedded systems. The reliability requirements are different in these two applications domain. In order to be employed in safety-critical applications, GPGPUs for embedded systems must be qualified as reliable. In this paper, we analyze through neutron irradiation typical parallel algorithms for embedded GPGPUs and we evaluate their reliability. We analyze how caches and threads distributions affect the GPGPU reliability. The data have been acquired through neutron test experiments, performed at the VESUVIO neutron facility at ISIS. The obtained experimental results show that, if the L1 cache of the considered GPGPU is disabled, the algorithm execution is most reliable. Moreover, it is demonstrated that during a FFT execution most errors appear in the stages in which the GPGPU is completely loaded as the number of instantiated parallel tasks is higher.
Keywords :
cache storage; embedded systems; fast Fourier transforms; general purpose computers; graphics processing units; parallel processing; safety-critical software; FFT; HPC; ISIS; VESUVIO neutron facility; caches distributions; embedded GPGPU; embedded systems; general purpose graphic processing units; high performance computing; neutron irradiation; parallel applications; safety critical applications; threads distributions; Aerospace electronics; Algorithm design and analysis; Embedded systems; Graphics processing units; Neutrons; Parallel algorithms; Reliability; General purpose graphic processing units (GPGPUs); radiation testing; single-event effects;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2014.2363358
Filename :
6940324
Link To Document :
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