DocumentCode :
1987130
Title :
RF MOSFET modeling accounting for distributed substrate and channel resistances with emphasis on the BSIM3v3 SPICE model
Author :
Liu, W. ; Gharpurey, R. ; Chang, M.C. ; Erdogan, U. ; Aggarwal, R. ; Mattia, J.P.
Author_Institution :
Texas Instrum., Dallas, TX, USA
fYear :
1997
fDate :
10-10 Dec. 1997
Firstpage :
309
Lastpage :
312
Abstract :
A r.f. MOSFET model generated for use in LIBRA simulation typically applies to only one bias point. The model and its parameters can be unphysical. It is desirable to establish a physical, scalable model capable of simulating both d.c. and r.f. characteristics and applicable to all the bias ranges. BSIM3 is a potential candidate, having demonstrated accuracy and scalability in the devices´ d.c. characteristics. When it is applied to simulate the s-parameters at r.f., we find BSIM3 to be somewhat problematic and two modifications are necessary to obtain a good fit. The first modification involves the addition of a bulk resistive network, achievable with a simple circuit extension to the existing BSIM3 model. The second improvement accounts for the finite channel resistance, whose origin lies in a nonquasi-static analysis. Since BSIM3 employs a quasi-static assumption, this improvement, while important, involves some changes in the BSIM3 source code.
Keywords :
MOSFET; S-parameters; SPICE; semiconductor device models; BSIM3v3 SPICE model; DC characteristics; LIBRA simulation; RF MOSFET; RF characteristics; S-parameters; bulk resistive network; device scalability; distributed channel resistance; distributed substrate resistance; nonquasi-static analysis; Circuit simulation; Cutoff frequency; Frequency measurement; Impedance measurement; Instruments; MOSFET circuits; Parasitic capacitance; SPICE; Scalability; Scattering parameters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International
Conference_Location :
Washington, DC, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-4100-7
Type :
conf
DOI :
10.1109/IEDM.1997.650388
Filename :
650388
Link To Document :
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