Title :
A 40-nm 640-µm2 45-dB opampless all-digital second-order MASH ΔΣ ADC
Author :
Konishi, Toshihiro ; Lee, Hyeokjong ; Izumi, Shintaro ; Yoshimoto, Masahiko ; Kawaguchi, Hiroshi
Author_Institution :
Kobe Univ., Kobe, Japan
Abstract :
This paper presents a second-order ΔΣ analog to digital converter (ADC) operating in a time domain. In the proposed ADC architecture, a voltage-controlled delay unit (VCDU) converts an input analog voltage to a delay time. Then the number of clocks output from a gated ring oscillator (GRO) is counted up during the delay time. Because no switched capacitor or opamp is used, the proposed ADC can be implemented in a small area and at low power. For the same reason, it has process scalability: it can be in keeping with Moore´s law. A time error is propagated to the second GRO by a multi-stage noise-shaping (MASH) topology, which provides second-order noise-shaping. In a standard 40-nm CMOS process, a SNDR of 45 dB is achievable at an input bandwidth of 3 MHz and a sampling rate of 100 MHz, where the power is 583.2 μW. Its area is 640 μm2.
Keywords :
analogue-digital conversion; delta-sigma modulation; analog to digital converter; analog voltage; bandwidth 3 MHz; delay time; frequency 100 MHz; gated ring oscillator; multistage noise-shaping topology; opampless all-digital second-order MASH delta-sigma ADC; power 583.2 muW; sampling rate; size 40 nm; switched capacitor; time domain; voltage-controlled delay unit; Delay; Inverters; Modulation; Multi-stage noise shaping; Quantization; Ring oscillators; Tin;
Conference_Titel :
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location :
Rio de Janeiro
Print_ISBN :
978-1-4244-9473-6
Electronic_ISBN :
0271-4302
DOI :
10.1109/ISCAS.2011.5937616