DocumentCode :
1987397
Title :
A new kinetic lattice Monte Carlo modeling framework for the source-drain selective epitaxial growth process
Author :
Renyu Chen ; Woosung Choi ; Schmidt, A. ; Keun-Ho Lee ; Youngkwan Park
Author_Institution :
Device Lab., Samsung Semicond. Inc., San Jose, CA, USA
fYear :
2013
fDate :
3-5 Sept. 2013
Firstpage :
9
Lastpage :
12
Abstract :
We have developed a new kinetic lattice Monte Carlo modeling framework for Si/Ge selective epitaxial growth based on neighbor binding interactions within the third-nearest-neighbor range of the diamond lattice. We find that first- and second-nearest-neighbor interactions contribute significantly to the faceting between {100} and {111}, while the third-nearest-neighbor interaction is the cause of {311} facet formation. The second-nearest-neighbor interaction also facilitates lateral growth and island formation within a plane. The simulated growth kinetics and shapes are in good agreement with experimental data.
Keywords :
Ge-Si alloys; Monte Carlo methods; diamond; epitaxial growth; semiconductor growth; Si-Ge; diamond lattice; growth kinetics; island formation; kinetic lattice Monte Carlo modeling framework; lateral growth; nearest neighbor interactions; neighbor binding interactions; source-drain selective epitaxial growth process; Adsorption; Atomic layer deposition; Epitaxial growth; Kinetic theory; Semiconductor process modeling; Silicon; Surface treatment; kinetic lattice Monte Carlo; selective epitaxial growth; source-drain engineering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on
Conference_Location :
Glasgow
ISSN :
1946-1569
Print_ISBN :
978-1-4673-5733-3
Type :
conf
DOI :
10.1109/SISPAD.2013.6650561
Filename :
6650561
Link To Document :
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