• DocumentCode
    1987397
  • Title

    A new kinetic lattice Monte Carlo modeling framework for the source-drain selective epitaxial growth process

  • Author

    Renyu Chen ; Woosung Choi ; Schmidt, A. ; Keun-Ho Lee ; Youngkwan Park

  • Author_Institution
    Device Lab., Samsung Semicond. Inc., San Jose, CA, USA
  • fYear
    2013
  • fDate
    3-5 Sept. 2013
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    We have developed a new kinetic lattice Monte Carlo modeling framework for Si/Ge selective epitaxial growth based on neighbor binding interactions within the third-nearest-neighbor range of the diamond lattice. We find that first- and second-nearest-neighbor interactions contribute significantly to the faceting between {100} and {111}, while the third-nearest-neighbor interaction is the cause of {311} facet formation. The second-nearest-neighbor interaction also facilitates lateral growth and island formation within a plane. The simulated growth kinetics and shapes are in good agreement with experimental data.
  • Keywords
    Ge-Si alloys; Monte Carlo methods; diamond; epitaxial growth; semiconductor growth; Si-Ge; diamond lattice; growth kinetics; island formation; kinetic lattice Monte Carlo modeling framework; lateral growth; nearest neighbor interactions; neighbor binding interactions; source-drain selective epitaxial growth process; Adsorption; Atomic layer deposition; Epitaxial growth; Kinetic theory; Semiconductor process modeling; Silicon; Surface treatment; kinetic lattice Monte Carlo; selective epitaxial growth; source-drain engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on
  • Conference_Location
    Glasgow
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4673-5733-3
  • Type

    conf

  • DOI
    10.1109/SISPAD.2013.6650561
  • Filename
    6650561