Title :
A Programmable Robust Current Reference in ROIC with Low Working Temperature
Author :
Tang, Ju ; Liu, Dan ; Chen, Zhongjian ; Zhang, Xing ; Ji, Lijiu
Author_Institution :
Institute of Microelectronics, Peking University, Beijing 100871, P. R. China. Email: tangju@ime.pku.edu.cn
Abstract :
This paper describes a programmable current reference which is designed to work stably over supply voltage in 77K without external component. It is designed to be used in an IRFPA ROIC (readout IC) as a reference current source. This current reference is based on CSMC 0.5 μm standard CMOS process with supply voltage of 5V. In low-precision testing condition, measurement result of the output current varies from about 80 nA to 120 nA with the supply voltage variation from 2.8V to 6V at room temperature.
Keywords :
CMOS process; Circuit stability; Circuit testing; Current measurement; Current supplies; MOSFETs; Microelectronics; Robustness; Temperature sensors; Voltage;
Conference_Titel :
Electron Devices and Solid-State Circuits, 2005 IEEE Conference on
Print_ISBN :
0-7803-9339-2
DOI :
10.1109/EDSSC.2005.1635260
