• DocumentCode
    1987653
  • Title

    Low-voltage embedded RAMs in the nanometer era

  • Author

    Kawahara, Takayuki

  • Author_Institution
    Central Research Laboratory, Hitachi Ltd., Kokubunji Tokyo 185-8601, Japan. tkawaha@crl.hitachi.co.jp
  • fYear
    2005
  • fDate
    19-21 Dec. 2005
  • Firstpage
    333
  • Lastpage
    338
  • Abstract
    Low-voltage nanometer-scale embedded RAM cells are described. First, low-voltage RAM cells are compared in terms of cell size, threshold voltage for MOS transistor, and signal charge. Second, the solution for 6T and 4T SRAM cells to widen the voltage margin are investigated, especially the advantages with a back-gate controlled thin buried-oxide fully-depleted SOI are presented. Then, DRAM approach with a novel twin- cell is discussed in terms of improving the retention time and low-voltage operation. These low-voltage cell technologies are the promising candidates for future embedded RAMs.
  • Keywords
    CMOS technology; Circuits; Laboratories; Logic; Low voltage; MOSFETs; Power dissipation; Random access memory; Threshold voltage; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Solid-State Circuits, 2005 IEEE Conference on
  • Print_ISBN
    0-7803-9339-2
  • Type

    conf

  • DOI
    10.1109/EDSSC.2005.1635275
  • Filename
    1635275