DocumentCode
1987710
Title
Test of Monolithic Microwave Integrated Circuits with Radiating Probes
Author
Helier, M. ; Bolomey, J. Ch
fYear
1983
fDate
3-8 Sept. 1983
Firstpage
641
Lastpage
645
Abstract
The principle of local electric field measurements on microwave integrated circuits with radiating probes is described. The main conclusions of the numerical modeling of the probes are discussed. Experimental methods and results of measurement on models and on a monolithic integrated amplifier are presented.
Keywords
Circuit testing; Electric variables measurement; Integrated circuit measurements; Integrated circuit testing; MMICs; Microwave integrated circuits; Microwave measurements; Monolithic integrated circuits; Numerical models; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1983. 13th European
Conference_Location
Nurnberg, Germany
Type
conf
DOI
10.1109/EUMA.1983.333310
Filename
4131963
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