DocumentCode :
1987710
Title :
Test of Monolithic Microwave Integrated Circuits with Radiating Probes
Author :
Helier, M. ; Bolomey, J. Ch
fYear :
1983
fDate :
3-8 Sept. 1983
Firstpage :
641
Lastpage :
645
Abstract :
The principle of local electric field measurements on microwave integrated circuits with radiating probes is described. The main conclusions of the numerical modeling of the probes are discussed. Experimental methods and results of measurement on models and on a monolithic integrated amplifier are presented.
Keywords :
Circuit testing; Electric variables measurement; Integrated circuit measurements; Integrated circuit testing; MMICs; Microwave integrated circuits; Microwave measurements; Monolithic integrated circuits; Numerical models; Probes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 1983. 13th European
Conference_Location :
Nurnberg, Germany
Type :
conf
DOI :
10.1109/EUMA.1983.333310
Filename :
4131963
Link To Document :
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