DocumentCode
1987917
Title
Isochronism defect for various doubly rotated cut quartz resonators
Author
Gufflet, N. ; Bourquin, R. ; Boy, J.J.
Author_Institution
ENSMM/LCEP, Besancon, France
Volume
2
fYear
1999
fDate
1999
Firstpage
784
Abstract
It has been shown in earlier work, that the amplitude-frequency effect (also called isochronism defect or anisochronism) could be a limitation factor on ultra-stable oscillators. Theoretical studies based on the non-linear theory of the piezoelectricity have already been developed to explain the amplitude-frequency effect. So it is possible to estimate the dependence of the isochronism defect versus design parameters of resonators (radius of curvature, electrodes diameter, overtone rank, ...). However, due to the unknown of the fourth order elastic coefficients, it is not possible to predict isochronism defect of any resonant frequency of a given energy trapped resonator. To tentatively find the orientation of a plate which does not exhibit an isochronism defect, we have realised electroded resonators with different orientations and curvatures. We present results which verify, particularly, R-1/2 dependence of amplitude-frequency effect versus radius of curvature. Moreover, we show that the isochronism defect can be positive or negative and can vary from one orientation to other one of about two orders of magnitude
Keywords
crystal resonators; quartz; SiO2; amplitude-frequency effect; anisochronism; design; doubly rotated cut quartz resonator; fourth order elastic coefficient; isochronism defect; nonlinear theory; piezoelectricity; plate orientation; radius of curvature; ultra-stable oscillator; Amplitude estimation; Circuits; Current measurement; Dielectrics; Electrodes; Frequency measurement; Phase measurement; Resonance; Resonant frequency; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location
Besancon
ISSN
1075-6787
Print_ISBN
0-7803-5400-1
Type
conf
DOI
10.1109/FREQ.1999.841422
Filename
841422
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