Title :
Growth of high quality single domain crystals of langasite family compounds
Author :
Chai, B. ; Qiu, H. ; Ji, Y.Y. ; Lefaucheur, J.L.
Author_Institution :
Crystal Photonics Inc., Sanford, FL, USA
Abstract :
Langasite family compounds have attracted a lot of attention because of the combination of a number of nice material properties such as high piezoelectric coupling, temperature compensation and low acoustic loss. Another very important property is that the compound melts congruently so that large single crystals of langasite can be produced by the conventional Czochralski melt pulling technique similar to that of LiNbO3 and LiTaO3. This makes the commercial scale production feasible. Nevertheless, despite the promises, the production of large commercial size langasite single crystal has always been erratic. We reported a year ago that langasite has both twinning and domain structure problems which were not recognized before. We developed the etching technique to reveal these crystal defects. In order to produce single domain crystals, a systematic process is established to screen the seed crystals so that the initial seed is twin-free, domain-free and low in dislocations. We also made special effort to reduce the temperature gradient within the growth chamber, since we have observed evidence of strain induced defects which an due to the growth anisotropy of the crystal. With all the changes in the growth process and growth environment, we are able to produce very high quality single domain crystals of the langasite family compounds including LGS, LGN and LGT
Keywords :
crystal growth from melt; lanthanum compounds; piezoelectric materials; Czochralski melt pulling; LGN; LGS; LGT; La3Ga5.5Nb0.5O14; La3Ga5.5Ta0.5O14; La3Ga5SiO14; acoustic loss; defect etching; langasite; piezoelectric material; seed; single domain crystal growth; temperature compensation; Acoustic materials; Capacitive sensors; Crystalline materials; Etching; Frequency; Optical losses; Photonic crystals; Piezoelectric materials; Production; Temperature distribution;
Conference_Titel :
Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European
Conference_Location :
Besancon
Print_ISBN :
0-7803-5400-1
DOI :
10.1109/FREQ.1999.841432