Title :
Proceedings. International Workshop on Memory Technology, Design and Testing (Cat. NO.97TB100159)
Abstract :
The following topics were dealt with: architectures; fault modelling; low-power circuits; embedded memories; memory testing; and software tools
Keywords :
cellular arrays; fault diagnosis; integrated circuit design; integrated circuit testing; integrated memory circuits; memory architecture; random-access storage; embedded memories; fault modelling; low-power circuits; memory architectures; memory testing; software tools;
Conference_Titel :
Memory Technology, Design and Testing, 1997. Proceedings., International Workshop on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8099-7
DOI :
10.1109/MTDT.1997.619386
