Complete X-ray orientation determination of quartz bars using a small scanning range

Author

Berger, H. ; Bradaczek, H. ; Hildebrandt, G.

Author_Institution

Res. Center, EFG Int. Berlin, Germany

Volume

2

fYear

1999

fDate

1999

Firstpage

851

Abstract

In order to determine the true AT cutting angle and the XX´ miscutting at the X face perpendicular to the rotation axis of quartz bars, three X-ray diffraction peaks have to be considered. Reflection combinations have been found which can be measured with sufficiently small errors in the relevant angles using two beams incident in two slightly different directions and scanning over a limited angular range in the order of the reflection widths. So, an automated measuring and bar-adjusting process can be established. An example of a suited reflection combination is given, and a corresponding arrangement based on it is proposed

Keywords

X-ray diffraction; crystal orientation; quartz; AT cutting angle; SiO₂; X face; X-ray diffraction; X-ray reflection; XX´ miscutting; crystal orientation; quartz bar; scanning range; Automatic control; Bars; Geometry; Goniometers; Lattices; Optical reflection; Performance evaluation; Position measurement; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency and Time Forum, 1999 and the IEEE International Frequency Control Symposium, 1999., Proceedings of the 1999 Joint Meeting of the European

Conference_Location

Besancon

ISSN

1075-6787

Print_ISBN

0-7803-5400-1

Type

conf

DOI

10.1109/FREQ.1999.841438

Filename

841438