• DocumentCode
    1988971
  • Title

    Design exploration of a 65 nm Sub-VT CMOS digital decimation filter chain

  • Author

    Sherazi, S. M Yasser ; Nilsson, Peter ; Akgun, Omer C. ; Sjöland, Henrik ; Rodrigues, Joachim Neves

  • Author_Institution
    Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
  • fYear
    2011
  • fDate
    15-18 May 2011
  • Firstpage
    837
  • Lastpage
    840
  • Abstract
    This paper presents an analysis on energy dissipation of digital half-band filters operating in the sub-threshold (sub-VT) region with throughput and supply voltage constraints. A 12-bit filter is implemented along with various unfolded structures, used to form a decimation filter chain. The designs are synthesized in a 65 nm low-leakage CMOS technology with various threshold voltages. A sub-VT energy model is applied to characterize the designs in the sub-VT domain. The results show that the low-leakage standard-threshold technology is suitable for the required throughput range between 250 Ksamples/s and 2 Msamples/s, at a supply voltage of 260 mV. The total energy dissipation of the filter is 205 fJ per sample.
  • Keywords
    CMOS digital integrated circuits; digital filters; design exploration; digital half-band filters; energy 205 fJ; energy dissipation; low-leakage standard-threshold technology; size 65 nm; sub-VT CMOS digital decimation filter chain; sub-VT energy model; sub-threshold region; supply voltage constraints; threshold voltage; voltage 260 mV; word length 12 bit; CMOS integrated circuits; Clocks; Computer architecture; Energy dissipation; Logic gates; Threshold voltage; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4244-9473-6
  • Electronic_ISBN
    0271-4302
  • Type

    conf

  • DOI
    10.1109/ISCAS.2011.5937696
  • Filename
    5937696