DocumentCode
1988971
Title
Design exploration of a 65 nm Sub-VT CMOS digital decimation filter chain
Author
Sherazi, S. M Yasser ; Nilsson, Peter ; Akgun, Omer C. ; Sjöland, Henrik ; Rodrigues, Joachim Neves
Author_Institution
Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
fYear
2011
fDate
15-18 May 2011
Firstpage
837
Lastpage
840
Abstract
This paper presents an analysis on energy dissipation of digital half-band filters operating in the sub-threshold (sub-VT) region with throughput and supply voltage constraints. A 12-bit filter is implemented along with various unfolded structures, used to form a decimation filter chain. The designs are synthesized in a 65 nm low-leakage CMOS technology with various threshold voltages. A sub-VT energy model is applied to characterize the designs in the sub-VT domain. The results show that the low-leakage standard-threshold technology is suitable for the required throughput range between 250 Ksamples/s and 2 Msamples/s, at a supply voltage of 260 mV. The total energy dissipation of the filter is 205 fJ per sample.
Keywords
CMOS digital integrated circuits; digital filters; design exploration; digital half-band filters; energy 205 fJ; energy dissipation; low-leakage standard-threshold technology; size 65 nm; sub-VT CMOS digital decimation filter chain; sub-VT energy model; sub-threshold region; supply voltage constraints; threshold voltage; voltage 260 mV; word length 12 bit; CMOS integrated circuits; Clocks; Computer architecture; Energy dissipation; Logic gates; Threshold voltage; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2011 IEEE International Symposium on
Conference_Location
Rio de Janeiro
ISSN
0271-4302
Print_ISBN
978-1-4244-9473-6
Electronic_ISBN
0271-4302
Type
conf
DOI
10.1109/ISCAS.2011.5937696
Filename
5937696
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